Consultant David Pittman, M.P.H., outlines which aspects of CMS’ mandatory two-sided risk model will be most challenging for ...
Abstract: In this work, we present a compact temperature-dependent model for bulk MOSFETs with applicability down to the cryogenic range of temperatures and validate it against the experimental data.
Abstract: Standard cells are essential components of modern digital circuit designs. With process technologies advancing toward 2nm, more routability issues have arisen due to the decreasing number of ...
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