EDN

Electroglas Intros Automated Defect Classification

Process management tools company Electroglas Inc. today introduced DefectID, its automatic defect classification software. Aimed at improving manufacturing productivity and yields for wafer ...
EDN

Electroglas adds auto defect classification to wafer inspection

SAN JOSE, Calif. – Electroglas Inc., a supplier of process management tools for the semiconductor industry, has introduced automatic defect classification software that it calls DefectID. DefectID ...
pv magazine International

Ensemble deep learning for PV cell defect detection

Researchers have tested eight stand-alone deep learning methods for PV cell fault detection and have found that their accuracy was as high as 73%. All methods were trained and tested on the ELPV ...
Semiconductor Engineering

Improving Yield With Machine Learning

Machine learning is becoming increasingly valuable in semiconductor manufacturing, where it is being used to improve yield and throughput. This is especially important in process control, where data ...
Science Daily

New coronary congenital disease classification aids identification of secondary defects

A new classification of coronary congenital diseases is set to help surgeons identify secondary defects in the operating theater. Clinical cardiologists will also know what to look for on ...