Santa Clara, Calif.—Agilent Technologies Inc. has expanded its Universal Serial Bus (USB) test portfolio with what it is calling the industry's first automated calibration of a USB 3.0 pattern ...
Design for testability (DFT) works to make a circuit more testable to ensure that it was manufactured correctly. Alfred Crouch explains the purpose of DFT in his book, Design-For-Test for Digital ICs ...
Design-for-test, or DFT, should facilitate high-quality test, not change the design. Test techniques and strategies need to supply a high-quality test that screens out defective devices, avoiding ...
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