IC designers now have a powerful weapon in the struggle against rising test costs: commercially available EDA solutions that provide fast and effective means to implement scan compression on-chip. By ...
The ability to control test cost while design sizes have grown exponentially is a success story that relies on the invention and continuous improvement of embedded test compression. One way test ...
The test and measurement industry is undergoing a major transformation, moving from a hardware- to a software-based model that will completely redefine engineering research and development processes.
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