ATPG targets faults at IC-gate boundaries, but 50% of defects are located within cells. Learn how cell-aware ATPG and user-defined fault models help to ferret out these hard-to-squash bugs.

Mixed-cell-height standard cell design and subsequent legalization represent critical steps in modern integrated circuit development. The technique involves the utilisation of standard cells with ...

A key limiting factor in standard cell based IC design is the standard cell library itself. This is because standard cell libraries don't offer the necessary variety of cells — in terms of ...

Manual and automated IC-layout tools are integrated in the PEYE Yield Finder analysis software. The combined yield-driven, standard-cell, design optimization flow facilitates the application of design ...

A new technical paper titled “Novel Transformer Model Based Clustering Method for Standard Cell Design Automation” was published by researchers at Nvidia. “Standard cells are essential components of ...

Standard cell libraries have been a mainstay of chip design for many decades since the inception of logic synthesis and composition methodologies. Cell library IP typically contains Verilog models ...

Power consumption is a major problem for emerging complex designs, particularly in designs requiring low power. The trend will accelerate as process technologies shrink into the ultra deep submicron ...