What is Scanning Ion Conductance Microscopy? Scanning Ion Conductance Microscopy (SICM) is a non-contact scanning probe microscopy technique that enables high-resolution imaging of living cells and ...
Scanning probe microscopy (SPM) is a set of advanced methods for surface analysis. The recent advances in SPM of metals, polymers, insulating, and semiconductive materials are primarily due to the ...
Schematic illustration of Friction Force Microscopy (FFM). The AFM cantilever, a small diving board-like structure about 200 micrometers long, 50 micrometers wide, and 1 micrometer thick, has a sharp ...
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