Coatings are required to remove or diminish the electrical charges that promptly accumulate in a nonconducting material when examined by a high-energy electron beam. Material samples investigated at ...

Scanning Electron Microscopy (SEM) has revolutionized the realm of microscopic analysis. By delivering astonishingly detailed images of minuscule entities such as insects, bacteria, or even the ...

SBFSEM is an automated technique used to acquire serial images in an SEM for 3D reconstruction, developed by Denk and Horstman 1 and marketed by Gatan as the 3View ® system. The resultant huge ...

The FEI Philips XL 40 Environmental Scanning Microscope (ESEM) is a large-chamber, tungsten source, environmental scanning electron microscope capable of high and low vacuum imaging. The FEI Philips ...

Since the 1950s, scientists have worked around this problem by coating samples with a thin layer of gold before imaging. While this approach made electron microscopy possible for countless discoveries ...

Scanning electron microscope images of an uncoated soot particle (left) revealing the aggregate structure made up of many tiny spheres, and four different coated soot particles (right) showing ...