A new technical paper titled “Novel Transformer Model Based Clustering Method for Standard Cell Design Automation” was published by researchers at Nvidia. “Standard cells are essential components of ...
Mixed-cell-height standard cell design and subsequent legalization represent critical steps in modern integrated circuit development. The technique involves the utilisation of standard cells with ...
Manual and automated IC-layout tools are integrated in the PEYE Yield Finder analysis software. The combined yield-driven, standard-cell, design optimization flow facilitates the application of design ...
Whereas the CPUs and similar ASICs of the 1970s had their transistors laid out manually, with the move from LSI to VLSI, it became necessary to optimize the process of laying out the transistors and ...
ATPG targets faults at IC-gate boundaries, but 50% of defects are located within cells. Learn how cell-aware ATPG and user-defined fault models help to ferret out these hard-to-squash bugs.